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A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

Author(s):

C.N. Jones, Jorge Goncalves
Conference/Journal:

vol. AUT08-04
Abstract:

This paper presents a simple, cost-effective and robust Atomic Force Microscope (AFM), which has been purpose designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students and as a result, the inner functioning of the microscope is clear to see. All but one part are off the shelf, and assembly time is less than two days, which makes the microscope a robust instrument, that is readily handled by the students with little chance of damage. While the scanning resolution is nowhere near that of a commercial instrument, it is more than sufficient to take interesting scans of micrometer-scaled objects.

Year:

2008
Type of Publication:

(04)Technical Report
Supervisor:



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% Autogenerated BibTeX entry
@TechReport { JonGon:2008:IFA_3094,
    author={C.N. Jones and Jorge Goncalves},
    title={{A Cost-Effective Atomic Force Microscope for Undergraduate
	  Control Laboratories}},
    institution={},
    year={2008},
    number={},
    address={},
    month=aug,
    url={http://control.ee.ethz.ch/index.cgi?page=publications;action=details;id=3094}
}
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