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A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

Author(s):

C.N. Jones, Jorge Goncalves
Conference/Journal:

IEEE Transactions on Education, To appear
Abstract:

This paper presents a simple, cost-effective and robust Atomic Force Microscope (AFM), which has been purpose designed and built for use as a teaching aid in undergraduate con- trols labs. The guiding design principle is to have all components be open and visible to the students and so the inner functioning of the microscope has been made clear to see. All of the parts but one are off the shelf, and assembly time is generally less than two days, which makes the microscope a robust instrument that is readily handled by the students with little chance of damage. While the scanning resolution is nowhere near that of a commercial instrument, it is more than sufficient to take interesting scans of micrometer-scale objects. A survey of students after their having used the AFM resulted in a generally good response, with 80% agreeing that they had a positive learning experience.

Year:

2010
Type of Publication:

(01)Article
Supervisor:



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% Autogenerated BibTeX entry
@Article { JonGon:2010:IFA_3463,
    author={C.N. Jones and Jorge Goncalves},
    title={{A Cost-Effective Atomic Force Microscope for Undergraduate
	  Control Laboratories}},
    journal={IEEE Transactions on Education},
    year={2010},
    volume={},
    number={},
    pages={},
    url={http://control.ee.ethz.ch/index.cgi?page=publications;action=details;id=3463}
}
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