Note: This content is accessible to all versions of every browser. However, this browser does not seem to support current Web standards, preventing the display of our site's design details.

  

The four pillars of nanopositioning for scanning probe microscopy

Author(s):

T. Tuma, A. Sebastian, J. Lygeros, A. Pantazi
Conference/Journal:

IEEE Control Systems Magazine, vol. 33, pp. 68-85
Abstract:

Since its birth in the 1980s, nanotechnology has significantly advanced our understanding and control of physical processes on the nanometer and subnanometer scale. Manipulation and interrogation of matter on these length scales have become indispensable in various fields of engineering and science and have been instrumental in some of the most exciting scientific and engineering breakthroughs of the past decades.

Year:

2013
Type of Publication:

(01)Article
Supervisor:



File Download:

Request a copy of this publication.
(Uses JavaScript)
% Autogenerated BibTeX entry
@Article { TumEtal:2013:IFA_4644,
    author={T. Tuma and A. Sebastian and J. Lygeros and A. Pantazi},
    title={{The four pillars of nanopositioning for scanning probe
	  microscopy}},
    journal={IEEE Control Systems Magazine},
    year={2013},
    volume={33},
    number={},
    pages={68--85},
    month=dec,
    url={http://control.ee.ethz.ch/index.cgi?page=publications;action=details;id=4644}
}
Permanent link