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Intelligent control for the next generation of fast scanning atomic force microscopes

Author(s):

G. Schitter
Conference/Journal:

ETH Zürich, no. 8843, pp. 99, Diploma Thesis at the Automatic Control Lab.
Abstract:



Year:

1999
Type of Publication:

(12)Diploma/Master Thesis
Supervisor:



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% Autogenerated BibTeX entry
@PhdThesis { Xxx:1999:IFA_833
}
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