Note: This content is accessible to all versions of every browser. However, this browser does not seem to support current Web standards, preventing the display of our site's design details.

  

Intelligent control for the next generation of fast scanning atomic force microscopes

Author(s):

G. Schitter, P.H. Menold, H.F. Knapp, A. Stemmer, F. Allgöwer
Conference/Journal:

Basel, Switzerland, Workshop: Scanning - Probe - Microscopies and Organic Materials VIII.
Abstract:



Year:

1999
Type of Publication:

(06)Talk
Supervisor:



No Files for download available.
% No recipe for automatically generating a BibTex entry for (06)Talk
Permanent link